Application Engineer V – Metrology (E5)

About the role

The candidate will be a general expert in on‑wafer metrology with specific expertise in optical thin‑film and X‑ray based metrology. They will work with process teams across Applied Materials to develop metrology applications that support product and process development, implement best practices, and provide data analysis.

Key responsibilities

• Develop applications based on optical film metrology techniques to qualify semiconductor process tools.
• Engage with key vendors to understand the latest metrology techniques and influence future roadmaps.
• Lead complex metrology application activities and internal/customer technical review meetings.
• Define customer technical requirements and create new methodologies to optimize system performance.

Required profile

• MS or higher in engineering or science with at least 5 years of relevant experience.
• Expertise in on‑wafer metrology, especially optical thin‑film techniques (Ellipsometry, Scatterometry, Reflectometry) and X‑ray based metrology.
• Proven ability to lead technical projects and mentor less‑experienced engineers.

Required skills

• Ellipsometry
• Scatterometry
• Reflectometry
• X‑ray based metrology
• Optical thin‑film metrology
• Data analysis for metrology applications

What we offer

• Salary range $163,000 – $224,000 per year.
• Location in Santa Clara, CA with supportive work culture and comprehensive benefits.