Focused Ion Beam (FIB) Technician

About the role

The FIB Technician supports semiconductor failure analysis, process development, and characterization by preparing high‑quality samples using Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), and Transmission Electron Microscopy (TEM) techniques. This role works in a fast‑paced laboratory environment, collaborating with engineers and customers to deliver accurate analytical data.

Key responsibilities

• Prepare TEM lamella samples using FIB and perform cross‑sectional and plan‑view imaging.
• Operate and maintain SEM, FIB, TEM and related metrology tools, including routine cleaning, calibrations and system checks.
• Monitor job queues, record analytical data and communicate results to engineers and customers.

Required profile

• Technical certification or equivalent experience in Materials Science, Engineering Technology, Electronics, Physics or a related field.
• Hands‑on experience as a FIB Technician in a semiconductor production or failure‑analysis laboratory.
• Ability to interpret engineering drawings and sample preparation requirements.

Required skills

• Focused Ion Beam (FIB) operation and sample preparation.
• Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) fundamentals.
• Energy Dispersive Spectroscopy (EDS) and Critical Dimension (CD) measurement techniques.
• Equipment maintenance, plasma cleaning, flashing and calibration.
• Proficiency with Microsoft Outlook and Microsoft Office.

What we offer

• Competitive hourly salary ranging from $33.00 to $45.70.
• Full‑time position based in Santa Clara, CA with a supportive, growth‑focused culture.